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Articles written by Xue, J.

  1. "A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology" Zhu, H., Zeng, X., Cai, W., Xue, J., and Zhou, D.. DATE '07: Proceedings of the conference on Design, automation and test in Europe. San Jose, CA, USA. 2007. pp. 1514--1519.