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Articles written by Zhu, H.
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"A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology" Zhu, H., Zeng, X., Cai, W., Xue, J., and Zhou, D.. DATE '07: Proceedings of the conference on Design, automation and test in Europe. San Jose, CA, USA.
2007.
pp. 1514--1519.